Scanning electron microscope

Cross sections and simple surface structures can be analyzed and photographed in our laboratory using a standard reflected-light microscope. However, microscope images with a high depth of field can no longer be visualized by using this conventional method. The scanning electron microscope provides a remedy at this point.

In contrast to the reflected-light microscope, the scanning electron microscope (SEM) enables images to be taken with high magnification and extremely high depth of field. We use this advantage specifically for the detailed representation and assessment of our produced surfaces, such as phosphatings, passivations and galvanic layers in the field of research and development.